T1X - Infinity location in local cordinates
T2X - Current location in local cordinates
R1X - Lead potiential in location in local cordinates
R2X - Far potiential in local cordinates 
Vp - Primary voltage difference (mV)
I - Input current (A)
Sp - Spontaineous polerization (mV)
QC - Quality control
IP[0],IP[1],IP[2],IP[3],IP[4],IP[5],IP[6],IP[7],IP[8],IP[9],IP[10],IP[11],IP[12],IP[13], 
IP[14],IP[15],IP[16],IP[17],IP[18],IP[19] - Raw IP gates reading (mV)
ResMeas - Raw resistivity (ohm*m)
Chg - Raw chargeability (mV/V)
Q  - Standard deviation of the IP stacks
Stack - The number of stacks 
RsCheck - The contact resistance for a potiential (ohm)
UTME_NAD83_8N & UTMN_NAD83_8N - Location of the plot point in UTM coordinates 
Date - Date the data was colected
DayTime - The time the data was colected
ResCalc - Calculated resistivity (ohm*m)
IP_Avg - Raw averaged induced polerization 
MF - Metal Factor   
N - Number of dipole separations away from the lead current the potiential is located
Stn - Station location local coordinates 
X  - Line location in local coordinates
Y  - Station location local coordinates
Z  - Elevation of the reading 
Topo - Topographic elevation 
T1_UTME & T1_UTMN - Infinity location in UTM cordinates
T2_UTME & T2_UTMN - Current location in UTM cordinates
R1_UTME & R1_UTMN - Lead potiential in location in UTM cordinates 
R2_UTME & R2_UTMN - Far potiential in UTM cordinates 
CalcAppRes - Calculated apparent resistivity 
IP_Err_final - Final standard deviation of the IP stacks        
IP_Final - Final averaged induced polerization    
Res_Final - Final calculated apparent resistivity
